Eberhart and Russell Model Based Stability Analysis in Sorghum [Sorghum bicolor L. (Moench)]
Dikshita Joshi *
Department of Genetics and Plant Breeding, RCA, MPUAT, Udaipur, Rajasthan (313001), India.
Hemlata Sharma
Department of Genetics and Plant Breeding, RCA, MPUAT, Udaipur, Rajasthan (313001), India.
*Author to whom correspondence should be addressed.
Abstract
Comparative assessment of sorghum genotypes requires consideration of grain yield consistency because yield responses differ among growing environments. A total of 57 entries were examined: ten parental genotypes, 45 half-diallel crosses and two checks (CSV 17 and CSV 23). During kharif 2024, the entries were grown at three Udaipur sites, namely the RCA and CTAE instructional farms of MPUAT and Krishi Vigyan Kendra, Badgaon. A randomised block design with three replications was followed at each site. Yield per plant was evaluated through the Eberhart and Russell regression approach, using the genotype mean, regression coefficient and deviation from regression as stability measures. The variance analysis detected significant variation among genotypes as well as a significant genotype-by-environment interaction for yield. Mean yields of individual entries extended from 50.72 to 126.67 g per plant. Applying the reported criteria identified seven crosses (P2 x P5, P2 x P8, P3 x P8, P4 x P6, P4 x P10, P6 x P8 and P8 x P10) as broadly stable. Another twelve crosses combined above-average grain yield with regression coefficients exceeding one and were classified as responsive to favourable conditions. In contrast, P3 x P10, P5 x P10, P6 x P9 and P6 x P10 were classified as suitable for unfavourable conditions. These results allow comparison of the adaptability of the crosses within the three environments included in this evaluation.
Keywords: Eberhart and Russell model, half diallel, multilocation, sorghum, stability